4 search results - page 1 / 1 » Reducing Test Point Area for BIST through Greater Use of Fun... |
DFT
2009
IEEE
13 years 11 months ago
2009
IEEE
Recently, a new test point insertion method for pseudo-random built-in self-test (BIST) was proposed in [Yang 09] which tries to use functional flip-flops to drive control test po...
TVLSI
2002
13 years 4 months ago
2002
Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...
ITC
2000
IEEE
13 years 8 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
TCAD
1998
13 years 4 months ago
1998
—Conventional scan design imposes considerable area and delay overheads. To establish a scan chain in the test mode, multiplexers at the inputs of flip-flops and scan wires are...