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DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
13 years 11 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
BMCBI
2010
160views more  BMCBI 2010»
13 years 5 months ago
Annotation of gene promoters by integrative data-mining of ChIP-seq Pol-II enrichment data
Background: Use of alternative gene promoters that drive widespread cell-type, tissue-type or developmental gene regulation in mammalian genomes is a common phenomenon. Chromatin ...
Ravi Gupta, Priyankara Wikramasinghe, Anirban Bhat...