7 search results - page 2 / 2 » Reliability-aware design for nanometer-scale devices |
ISMVL
2005
IEEE
13 years 11 months ago
2005
IEEE
As logic device sizes shrink towards the nanometer scale, a number of important physical limits threaten to soon halt further improvements in computer performance per unit cost. H...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
In recent literature it has been reported that Dynamic Power Management (DPM) may lead to decreased reliability in real-time embedded systems. The ever-shrinking device sizes cont...