Future microprocessors need low-cost solutions for reliable operation in the presence of failure-prone devices. A promising approach is to detect hardware faults by deploying low-...
Siva Kumar Sastry Hari, Sarita V. Adve, Helia Naei...
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
Andrea Pellegrini, Kypros Constantinides, Dan Zhan...