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APSEC
2005
IEEE
13 years 11 months ago
An Integrated Solution for Testing and Analyzing Java Applications in an Industrial Setting
Testing a large-scale, real-life commercial software application is a very challenging task due to the constant changes in the software, the involvement of multiple programmers an...
W. Eric Wong, J. Jenny Li
ICCAD
1998
IEEE
117views Hardware» more  ICCAD 1998»
13 years 10 months ago
CONCERT: a concurrent transient fault simulator for nonlinear analog circuits
This paper presents a novel concurrent fault simulator (called CONCERT) for nonlinear analog circuits. Three primary techniques in CONCERT, including fault ordering, state predict...
Junwei Hou, Abhijit Chatterjee
ISSTA
2010
ACM
13 years 8 months ago
OCAT: object capture-based automated testing
Testing object-oriented (OO) software is critical because OO languages are commonly used in developing modern software systems. In testing OO software, one important and yet chall...
Hojun Jaygarl, Sunghun Kim, Tao Xie, Carl K. Chang
MICRO
2006
IEEE
117views Hardware» more  MICRO 2006»
13 years 12 months ago
PathExpander: Architectural Support for Increasing the Path Coverage of Dynamic Bug Detection
Dynamic software bug detection tools are commonly used because they leverage run-time information. However, they suffer from a fundamental limitation, the Path Coverage Problem: t...
Shan Lu, Pin Zhou, Wei Liu, Yuanyuan Zhou, Josep T...
COMPSAC
2009
IEEE
13 years 3 months ago
Towards Call for Testing: An Application to User Acceptance Testing of Web Applications
1 The paper proposes a new test model, Call-For-Testing (CFT), and applies it to User Acceptance Testing (UAT) of Web Applications. Different from traditional approaches, UAT in th...
Lian Yu, Wei Zhao, Xiaofeng Di, Changzhu Kong, Wen...