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DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
13 years 11 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
CL
2008
Springer
13 years 4 months ago
Automatic synthesis and verification of real-time embedded software for mobile and ubiquitous systems
Currently available application frameworks that target the automatic design of real-time embedded software are poor in integrating functional and non-functional requirements for m...
Pao-Ann Hsiung, Shang-Wei Lin