12 search results - page 1 / 3 » STARBIST: Scan Autocorrelated Random Pattern Generation |
DAC
1997
ACM
13 years 8 months ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
IJNSEC
2010
12 years 11 months ago
2010
Chaotic systems have many interesting features such as sensitivity on initial condition and system parameter, ergodicity and mixing properties. In this paper, we exploit these int...
ITC
1996
IEEE
13 years 8 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
DATE
1999
IEEE
13 years 8 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...