19 search results - page 4 / 4 » Scanner identification using spectral noise in the frequency... |
ICCAD
1996
IEEE
13 years 9 months ago
1996
IEEE
The analysis of CMOS VLSI circuit switching current has become an increasingly important and difficult task from both a VLSI design and simulation software perspective. This paper...
JCP
2006
13 years 5 months ago
2006
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...
VTC
2007
IEEE
13 years 11 months ago
2007
IEEE
—This paper presents a downlink performance analysis of a Layered Random Beamforming (LRB) - MIMO-OFDMA Physical Layer (PHY) as applicable to future generation wireless communica...
GECCO
2003
Springer
13 years 10 months ago
2003
Springer
A robust structural damage detection method that can handle noisy frequency response function information is discussed. The inherent unstructured nature of damage detection problem...