9 search results - page 1 / 2 » Selecting partial scan flip-flops for circuit partitioning |
DATE
1998
IEEE
13 years 8 months ago
1998
IEEE
Partial Scan techniques have been widely accepted as an effective solution to improve sequential ATPG performance while keeping acceptable area and performance overheads. Several ...
ICCAD
1994
IEEE
13 years 8 months ago
1994
IEEE
This paper presents a new method of selecting scan
ipops (FFs) in partial scan designs of sequential circuits. Scan FFs are chosen so that the whole circuit can be partitioned in...
IJFCS
1998
13 years 3 months ago
1998
Directed acyclic graphs (dags) are often used to model circuits. Path lengths in such dags represent circuit delays. In the vertex splitting problem, the objective is to determine...
ET
2000
13 years 4 months ago
2000
An efficient deterministic BIST scheme based on partial scan chains together with a scan selection algorithm tailored for BIST is presented. The algorithm determines a minimum num...
ASPDAC
1995
ACM
13 years 7 months ago
1995
ACM
Abstract - An approach to top down design for testability using register-transfer level(RTL) partial scan selection is described. We propose a scan selection technique based on tes...