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» Self-Adaptive Data Caches for Soft-Error Reliability
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TCAD
2008
88views more  TCAD 2008»
13 years 3 months ago
Self-Adaptive Data Caches for Soft-Error Reliability
Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches' dominant share in die area and tr...
Shuai Wang, Jie S. Hu, Sotirios G. Ziavras
LCTRTS
2010
Springer
13 years 8 months ago
Cache vulnerability equations for protecting data in embedded processor caches from soft errors
Continuous technology scaling has brought us to a point, where transistors have become extremely susceptible to cosmic radiation strikes, or soft errors. Inside the processor, cac...
Aviral Shrivastava, Jongeun Lee, Reiley Jeyapaul
CASES
2006
ACM
13 years 9 months ago
Mitigating soft error failures for multimedia applications by selective data protection
With advances in process technology, soft errors (SE) are becoming an increasingly critical design concern. Due to their large area and high density, caches are worst hit by soft ...
Kyoungwoo Lee, Aviral Shrivastava, Ilya Issenin, N...
SIGMETRICS
2011
ACM
178views Hardware» more  SIGMETRICS 2011»
12 years 6 months ago
Soft error benchmarking of L2 caches with PARMA
The amount of charge stored in an SRAM cell shrinks rapidly with each technology generation thus increasingly exposing caches to soft errors. Benchmarking the FIT rate of caches d...
Jinho Suh, Mehrtash Manoochehri, Murali Annavaram,...
PRDC
2006
IEEE
13 years 9 months ago
SEVA: A Soft-Error- and Variation-Aware Cache Architecture
As SRAM devices are scaled down, the number of variation-induced defective memory cells increases rapidly. Combination of ECC, particularly SECDED, with a redundancy technique can...
Luong Dinh Hung, Masahiro Goshima, Shuichi Sakai