6 search results - page 1 / 2 » Self-calibrating Online Wearout Detection |
MICRO
2007
IEEE
13 years 11 months ago
2007
IEEE
Technology scaling, characterized by decreasing feature size, thinning gate oxide, and non-ideal voltage scaling, will become a major hindrance to microprocessor reliability in fu...
ETS
2011
IEEE
12 years 5 months ago
2011
IEEE
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
ICCAD
2010
IEEE
13 years 3 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
ASPLOS
2006
ACM
13 years 11 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...