4 search results - page 1 / 1 » Self-test methodology for at-speed test of crosstalk in chip... |
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
DAC
2000
ACM
14 years 5 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
DAC
2001
ACM
14 years 5 months ago
2001
ACM
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
DAC
1999
ACM
13 years 8 months ago
1999
ACM
As the family of Alpha microprocessors continues to scale into more advanced technologies with very high frequency edge rates and multiple layers of interconnect, the issue of cha...