We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
In this paper, we make two major contributions: First, to enhance Boolean learning, we propose a new class of logic implications called extended forward implications. Using a nove...
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...