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» Sequential Circuits for Relational Analysis
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ATS
2000
IEEE
145views Hardware» more  ATS 2000»
13 years 8 months ago
Compaction-based test generation using state and fault information
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
DATE
2009
IEEE
202views Hardware» more  DATE 2009»
13 years 10 months ago
Design as you see FIT: System-level soft error analysis of sequential circuits
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
Daniel Holcomb, Wenchao Li, Sanjit A. Seshia
DATE
2007
IEEE
154views Hardware» more  DATE 2007»
13 years 10 months ago
Soft error rate analysis for sequential circuits
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
Natasa Miskov-Zivanov, Diana Marculescu
ICCD
2005
IEEE
135views Hardware» more  ICCD 2005»
14 years 17 days ago
Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults
In this paper, we make two major contributions: First, to enhance Boolean learning, we propose a new class of logic implications called extended forward implications. Using a nove...
Manan Syal, Rajat Arora, Michael S. Hsiao
ISQED
2007
IEEE
135views Hardware» more  ISQED 2007»
13 years 10 months ago
MARS-S: Modeling and Reduction of Soft Errors in Sequential Circuits
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
Natasa Miskov-Zivanov, Diana Marculescu