22 search results - page 5 / 5 » Sequential circuit test generation using dynamic state trave... |
FMCAD
2000
Springer
13 years 9 months ago
2000
Springer
Image computation nds wide application in VLSI CAD, such as state reachability analysis in formal veri cation and synthesis, combinational veri cation, combinational and sequential...
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...