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» Simulation Results of an Efficient Defect-Analysis Procedure
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ITC
1994
IEEE
111views Hardware» more  ITC 1994»
13 years 8 months ago
Simulation Results of an Efficient Defect-Analysis Procedure
For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...
Olaf Stern, Hans-Joachim Wunderlich
WSC
1996
13 years 6 months ago
Experimental Evaluation of Confidence Interval Procedures in Sequential Steady-State Simulation
Sequential analysis of simulation output is generally accepted as the most efficient way for securing representativeness of samples of collected observations. In this scenario a s...
Donald C. McNickle, Krzysztof Pawlikowski, Gregory...
INFORMS
2000
128views more  INFORMS 2000»
13 years 4 months ago
A Revised Simplex Search Procedure for Stochastic Simulation Response Surface Optimization
We develop a variant of the Nelder-Mead (NM) simplex search procedure for stochastic simulation optimization that is designed to avoid many of the weaknesses encumbering such dire...
David G. Humphrey, James R. Wilson
WSC
2004
13 years 6 months ago
An Odds-Ratio Indifference-Zone Selection Procedure for Bernoulli Populations
We present a new sequential, eliminating procedure for selecting the best system in a single-factor Bernoulli-response experiment with an odds-ratio indifference zone, where best ...
Jamie R. Wieland, Barry L. Nelson
TVCG
2010
151views more  TVCG 2010»
12 years 11 months ago
Interactive Visual Analysis of Multiple Simulation Runs Using the Simulation Model View: Understanding and Tuning of an Electron
Multiple simulation runs using the same simulation model with different values of control parameters usually generate large data sets that capture the variational aspects of the be...
Kresimir Matkovic, Denis Gracanin, Mario Jelovic, ...