13 search results - page 1 / 3 » Soft error rate determination for nanoscale sequential logic |
ISQED
2010
IEEE
13 years 9 months ago
2010
IEEE
We analyze the neutron induced soft error rate (SER) by modeling induced error pulse using two parameters, occurrence frequency and probability density function for the pulse widt...
ICCD
2008
IEEE
14 years 1 months ago
2008
IEEE
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
MICRO
2006
IEEE
13 years 4 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...