Soft errors are a growing concern for processor reliability. Recent work has motivated architecture-level studies of soft errors since the architecture can mask many raw errors an...
Xiaodong Li, Sarita V. Adve, Pradip Bose, Jude A. ...
Feature sizes in VLSI circuits are steadily shrinking. This results in increasing susceptibility to soft errors, e.g. due to environmental radiation. Precautions against soft error...
Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to deve...
Jungsub Kim, Mary Jane Irwin, Narayanan Vijaykrish...