This paper presents a controlled experiment comparing the defect detection efficiency of exploratory testing (ET) and test case based testing (TCT). While traditional testing lite...
In safety-critical and high-reliability systems, software development and maintenance are costly endeavors. The cost can be reduced if software errors can be identified through au...
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future ...
Kypros Constantinides, Onur Mutlu, Todd M. Austin,...
Inspections can be used to identify defects in software artifacts. In this way, inspection methods help to improve software quality, especially when used early in software develop...
Guilherme Travassos, Forrest Shull, Michael Freder...
Although processor design verification consumes ever-increasing resources, many design defects still slip into production silicon. In a few cases, such bugs have caused expensive...
Smruti R. Sarangi, Abhishek Tiwari, Josep Torrella...