4 search results - page 1 / 1 » Spectral RTL Test Generation for Microprocessors |
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
VLSID
2007
IEEE
14 years 5 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
TVLSI
2008
13 years 4 months ago
2008
With increasing levels of integration of multiple processing cores and new features to support software functionality, recent generations of microprocessors face difficult validati...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Interrupt behaviors, especially the external ones, are difficult to verify in a microprocessor design project in that they involve both interacting hardware and software. This pap...