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DATE
1998
IEEE
13 years 9 months ago
1998
IEEE
We extend the subsequence removal technique to provide signi cantly higher static compaction for sequential circuits. We show that state relaxation techniques can be used to ident...
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...