3 search results - page 1 / 1 » State-Sensitive X-Filling Scheme for Scan Capture Power Redu... |
TCAD
2008
13 years 4 months ago
2008
DATE
2009
IEEE
13 years 8 months ago
2009
IEEE
Growing test data volume and overtesting caused by excessive scan capture power are two of the major concerns for the industry when testing large integrated circuits. Various test...
ICCAD
2008
IEEE
14 years 1 months ago
2008
IEEE
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...