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ICCD
2006
IEEE
157views Hardware» more  ICCD 2006»
11 years 1 months ago
Statistical Analysis of Power Grid Networks Considering Lognormal Leakage Current Variations with Spatial Correlation
— As the technology scales into 90nm and below, process-induced variations become more pronounced. In this paper, we propose an efficient stochastic method for analyzing the vol...
Ning Mi, Jeffrey Fan, Sheldon X.-D. Tan
DAC
2005
ACM
11 years 5 months ago
Full-chip analysis of leakage power under process variations, including spatial correlations
In this paper, we present a method for analyzing the leakage current, and hence the leakage power, of a circuit under process parameter variations that can include spatial correla...
Hongliang Chang, Sachin S. Sapatnekar
ICCD
2007
IEEE
322views Hardware» more  ICCD 2007»
11 years 1 months ago
Voltage drop reduction for on-chip power delivery considering leakage current variations
In this paper, we propose a novel on-chip voltage drop reduction technique for on-chip power delivery networks of VLSI systems in the presence of variational leakage current sourc...
Jeffrey Fan, Ning Mi, Sheldon X.-D. Tan
DAC
2006
ACM
11 years 5 months ago
Stochastic variational analysis of large power grids considering intra-die correlations
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
Praveen Ghanta, Sarma B. K. Vrudhula, Sarvesh Bhar...
DATE
2007
IEEE
118views Hardware» more  DATE 2007»
10 years 10 months ago
Statistical model order reduction for interconnect circuits considering spatial correlations
In this paper, we propose a novel statistical model order reduction technique, called statistical spectrum model order reduction (SSMOR) method, which considers both intra-die and...
Jeffrey Fan, Ning Mi, Sheldon X.-D. Tan, Yici Cai,...
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