2 search results - page 1 / 1 » Statistical Modeling With the PSP MOSFET Model |
TCAD
2010
12 years 11 months ago
2010
PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...
ICASSP
2010
IEEE
13 years 3 months ago
2010
IEEE
In recent work, we proposed an alternative to parallel text as translation model (TM) training data: audio recordings of parallel speech (pSp), as it occurs in any communication s...