686 search results - page 4 / 138 » Statistical Timing Analysis with Extended Pseudo-Canonical T... |
GECCO
2000
Springer
13 years 9 months ago
2000
Springer
In previous work we showed, by Walsh analysis, that summary statistics such as mean, variance, skew, and higher order statistics can be computed in polynomial time for embedded la...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
Current source based cell models are becoming a necessity for accurate timing and noise analysis at 65nm and below. Voltage waveform shapes are increasingly more difficult to repr...
ISQED
2000
IEEE
13 years 10 months ago
2000
IEEE
The lognormal has been traditionally used to model the failure time distribution of electromigration failures. However, when used to estimate the failure of large metal layers, it...
DATE
2010
IEEE
13 years 11 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
GRID
2008
Springer
13 years 5 months ago
2008
Springer
The existence of good probabilistic models for the job arrival process and the delay components introduced at different stages of job processing in a Grid environment is important ...