2 search results - page 1 / 1 » Statistical modeling and simulation of threshold variation u... |
DAC
2008
ACM
14 years 5 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...