23 search results - page 1 / 5 » Statistical technology mapping for parametric yield |
ICCAD
2005
IEEE
14 years 2 months ago
2005
IEEE
The increasing variability of process parameters leads to substantial parametric yield losses due to timing and leakage power constraints. Leakage power is especially affected by ...
FPGA
2007
ACM
13 years 11 months ago
2007
ACM
Variations in the semiconductor fabrication process results in variability in parameters between transistors on the same die, a problem exacerbated by lithographic scaling. The re...
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents an efficient statistical design methodology that allows simultaneous sizing for performance and optimization for yield and robustness of analog circuits. The s...
ICCAD
2005
IEEE
14 years 2 months ago
2005
IEEE
— As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as sta...
ISBI
2009
IEEE
14 years 4 days ago
2009
IEEE
We present a novel approach to change detection between two brain MRI scans (reference and target.) The proposed method uses a single modality to find subtle changes; and does no...