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» Statistical technology mapping for parametric yield
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BMCBI
2010
124views more  BMCBI 2010»
13 years 5 months ago
A factor model to analyze heterogeneity in gene expression
Background: Microarray technology allows the simultaneous analysis of thousands of genes within a single experiment. Significance analyses of transcriptomic data ignore the gene d...
Yuna Blum, Guillaume Le Mignon, Sandrine Lagarrigu...
WWW
2009
ACM
14 years 6 months ago
Matchbox: large scale online bayesian recommendations
We present a probabilistic model for generating personalised recommendations of items to users of a web service. The Matchbox system makes use of content information in the form o...
David H. Stern, Ralf Herbrich, Thore Graepel
DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
14 years 4 days ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...