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DAC
2006
ACM
10 years 2 months ago
Stochastic variational analysis of large power grids considering intra-die correlations
For statistical timing and power analysis that are very important problems in the sub-100nm technologies, stochastic analysis of power grids that characterizes the voltage fluctua...
Praveen Ghanta, Sarma B. K. Vrudhula, Sarvesh Bhar...
ICCD
2006
IEEE
157views Hardware» more  ICCD 2006»
9 years 10 months ago
Statistical Analysis of Power Grid Networks Considering Lognormal Leakage Current Variations with Spatial Correlation
— As the technology scales into 90nm and below, process-induced variations become more pronounced. In this paper, we propose an efficient stochastic method for analyzing the vol...
Ning Mi, Jeffrey Fan, Sheldon X.-D. Tan
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
9 years 7 months ago
Stochastic Power Grid Analysis Considering Process Variations
In this paper, we investigate the impact of interconnect and device process variations on voltage fluctuations in power grids. We consider random variations in the power grid’s...
Praveen Ghanta, Sarma B. K. Vrudhula, Rajendran Pa...
DATE
2007
IEEE
118views Hardware» more  DATE 2007»
9 years 7 months ago
Statistical model order reduction for interconnect circuits considering spatial correlations
In this paper, we propose a novel statistical model order reduction technique, called statistical spectrum model order reduction (SSMOR) method, which considers both intra-die and...
Jeffrey Fan, Ning Mi, Sheldon X.-D. Tan, Yici Cai,...
ICCAD
2003
IEEE
195views Hardware» more  ICCAD 2003»
9 years 6 months ago
Vectorless Analysis of Supply Noise Induced Delay Variation
The impact of power supply integrity on a design has become a critical issue, not only for functional verification, but also for performance verification. Traditional analysis has...
Sanjay Pant, David Blaauw, Vladimir Zolotov, Savit...
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