2 search results - page 1 / 1 » Stuck-fault tests vs. actual defects |
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
ESEM
2007
ACM
13 years 8 months ago
2007
ACM
This paper presents a controlled experiment comparing the defect detection efficiency of exploratory testing (ET) and test case based testing (TCT). While traditional testing lite...