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    DATE
    2006
    IEEE
    115views Hardware» more  DATE 2006»
    Optimal periodic testing of intermittent faults in embedded pipelined processor applications
    13 years 10 months ago
    Optimal periodic testing of intermittent faults in embedded pipelined processor applications
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    Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
    Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
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    SBCCI
    2005
    ACM
    185views VLSI» more  SBCCI 2005»
    Automatic generation of test sets for SBST of microprocessor IP cores
    13 years 10 months ago
    Automatic generation of test sets for SBST of microprocessor IP cores
    Download  www.cad.polito.it
    Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
    Ernesto Sánchez, Matteo Sonza Reorda, Giova...
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