8 search results - page 2 / 2 » Techniques for Transient Fault Sensitivity Analysis and Redu... |
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
ISLPED
1997
ACM
13 years 9 months ago
1997
ACM
In this paper we present a methodology and techniques for generating cycle-accurate macro-models for RTlevel power analysis. The proposed macro-model predicts not only...