82 search results - page 2 / 17 » Techniques to Reduce Data Volume and Application Time for Tr... |
DAC
2003
ACM
13 years 10 months ago
2003
ACM
We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...
IJVR
2008
13 years 4 months ago
2008
Real-time virtual heritage application is normally executed with a high performance computer system. This is due to the complexity and highly computational cost which makes such sy...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...