Continuous technology scaling has brought us to a point, where transistors have become extremely susceptible to cosmic radiation strikes, or soft errors. Inside the processor, cac...
This paper presents a new fault injection tool called Exhaustif (Exhaustive Workbench for Systems Reliability). Exhaustif is a SWIFI fault injection tool for fault tolerance verif...
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
While NAND flash memories have rapidly increased in both capacity and performance and are increasingly used as a storage device in many embedded systems, their reliability has de...