249 search results - page 4 / 50 » Test Coverage Analysis and Preservation for Requirements-Bas... |
DT
1998
13 years 5 months ago
1998
ITC
2000
IEEE
13 years 10 months ago
2000
IEEE
FATES
2004
Springer
13 years 11 months ago
2004
Springer
We present a technique for specifying coverage criteria and a method for generating test suites for systems whose behaviours can be described as extended finite state machines (EF...
MTDT
2003
IEEE
13 years 11 months ago
2003
IEEE
: Linked faults are very important for memory testing because they reduce the fault coverage of the tests. Their analysis has proven to be a source for new memory tests, characteri...
ATS
2000
IEEE
13 years 10 months ago
2000
IEEE
: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...