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DATE
2002
IEEE
114views Hardware» more  DATE 2002»
9 years 3 days ago
Test Enrichment for Path Delay Faults Using Multiple Sets of Target Faults
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. We show that such ...
Irith Pomeranz, Sudhakar M. Reddy
DAC
2005
ACM
8 years 9 months ago
Path delay test compaction with process variation tolerance
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, T...
ASPDAC
2004
ACM
112views Hardware» more  ASPDAC 2004»
9 years 17 days ago
Longest path selection for delay test under process variation
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
Xiang Lu, Zhuo Li, Wangqi Qiu, D. M. H. Walker, We...
DATE
2002
IEEE
94views Hardware» more  DATE 2002»
9 years 3 days ago
Exact Grading of Multiple Path Delay Faults
The problem of fault grading for multiple path delay faults is studied and a method of obtaining the exact coverage is presented. The faults covered are represented and manipulate...
Saravanan Padmanaban, Spyros Tragoudas
JISE
2000
68views more  JISE 2000»
8 years 7 months ago
Testable Path Delay Fault Cover for Sequential Circuits
We present an algorithm for identifyinga set of faults that do not have to be targeted by a sequential delay fault test generator. These faults either cannot independently aect th...
Angela Krstic, Srimat T. Chakradhar, Kwang-Ting Ch...
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