37 search results - page 1 / 8 » Test Enrichment for Path Delay Faults Using Multiple Sets of... |
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
Test sets for path delay faults in circuits with large numbers of paths are typically generated for path delay faults associated with the longest circuit paths. We show that such ...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
ASPDAC
2004
ACM
13 years 10 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
The problem of fault grading for multiple path delay faults is studied and a method of obtaining the exact coverage is presented. The faults covered are represented and manipulate...
JISE
2000
13 years 4 months ago
2000
We present an algorithm for identifyinga set of faults that do not have to be targeted by a sequential delay fault test generator. These faults either cannot independently aect th...