203 search results - page 41 / 41 » Test Generation and Fault Localization for Quantum Circuits |
DDECS
2007
IEEE
13 years 12 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
DAC
2001
ACM
14 years 6 months ago
2001
ACM
This paper presents the design and evaluation of an 8-bit adiabatic multiplier. Both the multiplier core and its built-in self-test logic have been designed using a true single-ph...
LCTRTS
2009
Springer
14 years 11 days ago
2009
Springer
Register file (RF) is extremely vulnerable to soft errors, and traditional redundancy based schemes to protect the RF are prohibitive not only because RF is often in the timing c...