23 search results - page 1 / 5 » Test Generation for Gigahertz Processors Using an Automatic ... |
DAC
1999
ACM
13 years 8 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
MTV
2005
IEEE
13 years 10 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
DATE
2004
IEEE
13 years 8 months ago
2004
IEEE
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
DAC
2003
ACM
14 years 5 months ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
RSP
2003
IEEE
13 years 9 months ago
2003
IEEE
As embedded systems continue to face increasingly higher performance requirements, deeply pipelined processor architectures are being employed to meet desired system performance. ...