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DSD
2010
IEEE
171views Hardware» more  DSD 2010»
13 years 2 months ago
Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
Jiri Balcarek, Petr Fiser, Jan Schmidt
ICCAD
1999
IEEE
148views Hardware» more  ICCAD 1999»
13 years 8 months ago
SAT based ATPG using fast justification and propagation in the implication graph
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...
Paul Tafertshofer, Andreas Ganz