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VTS
2002
IEEE
138views Hardware» more  VTS 2002»
13 years 8 months ago
Test Power Reduction through Minimization of Scan Chain Transitions
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
ICCAD
2007
IEEE
135views Hardware» more  ICCAD 2007»
14 years 16 days ago
A selective pattern-compression scheme for power and test-data reduction
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
Chia-Yi Lin, Hung-Ming Chen
ITC
2002
IEEE
114views Hardware» more  ITC 2002»
13 years 8 months ago
Scan Power Reduction Through Test Data Transition Frequency Analysis
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
ICCD
2003
IEEE
143views Hardware» more  ICCD 2003»
13 years 9 months ago
Aggressive Test Power Reduction Through Test Stimuli Transformation
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...
Ozgur Sinanoglu, Alex Orailoglu
ATS
2004
IEEE
126views Hardware» more  ATS 2004»
13 years 7 months ago
Alternative Run-Length Coding through Scan Chain Reconfiguration for Joint Minimization of Test Data Volume and Power Consumptio
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...
Youhua Shi, Shinji Kimura, Nozomu Togawa, Masao Ya...