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DATE
2009
IEEE
93views Hardware» more  DATE 2009»
13 years 10 months ago
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...
TCAD
2008
119views more  TCAD 2008»
13 years 3 months ago
Bridging Fault Test Method With Adaptive Power Management Awareness
Abstract--A key design constraint of circuits used in handheld devices is the power consumption, mainly due to battery life limitations. Adaptive power management (APM) techniques ...
S. Saqib Khursheed, Urban Ingelsson, Paul M. Rosin...