112 search results - page 23 / 23 » Test generation in VLSI circuits for crosstalk noise |
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
DAC
2001
ACM
14 years 6 months ago
2001
ACM
This paper presents the design and evaluation of an 8-bit adiabatic multiplier. Both the multiplier core and its built-in self-test logic have been designed using a true single-ph...