1610 search results - page 1 / 322 » Testing Patterns |
DSD
2010
IEEE
13 years 3 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
SERP
2007
13 years 6 months ago
2007
- Functional testing of software dedicated for hybrid embedded systems should start at the early development phase and requires analysis of discrete and continuous signals, where t...
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
MCS
2008
Springer
13 years 4 months ago
2008
Springer