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» Testing Static and Dynamic Faults in Random Access Memories
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DATE
2002
IEEE
98views Hardware» more  DATE 2002»
13 years 10 months ago
A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael ...
POS
1987
Springer
13 years 9 months ago
Realisation of a Dynamically Grouped Object-Oriented Virtual Memory Hierarchy
Conventional paging systems do not perform well with large object-oriented environments (such as Smalltalk-801 [GR83]) due to the fine granularity of objects and the persistence o...
Ifor Williams, Mario Wolczko, T. P. Hopkins
NDSS
2008
IEEE
13 years 12 months ago
Automated Whitebox Fuzz Testing
Fuzz testing is an effective technique for finding security vulnerabilities in software. Traditionally, fuzz testing tools apply random mutations to well-formed inputs of a progr...
Patrice Godefroid, Michael Y. Levin, David A. Moln...
VLSID
2002
IEEE
96views VLSI» more  VLSID 2002»
13 years 10 months ago
Strategies for Improving Data Locality in Embedded Applications
This paper introduces a dynamic layout optimization strategy to minimize the number of cycles spent in memory accesses in a cache-based memory environment. In this approach, a giv...
N. E. Crosbie, Mahmut T. Kandemir, Ibrahim Kolcu, ...
COMPSAC
1999
IEEE
13 years 9 months ago
Testing Extensible Design Patterns in Object-Oriented Frameworks through Scenario Templates
Design patterns have been used in object-oriented frameworks such as the IBM San Francisco framework, Apple's Rhaspody, OpenStep, and WebObjects, and DIWB. However, few guide...
Wei-Tek Tsai, Yongzhong Tu, Weiguang Shao, Ezra Eb...