80 search results - page 16 / 16 » Testing embedded-core based system chips |
LCTRTS
2009
Springer
14 years 10 days ago
2009
Springer
Register file (RF) is extremely vulnerable to soft errors, and traditional redundancy based schemes to protect the RF are prohibitive not only because RF is often in the timing c...
TECS
2008
13 years 5 months ago
2008
tion. Transaction Level Modeling (TLM) has been proposed to abstract communication for highspeed system simulation and rapid design space exploration. Although being widely accepte...
FCCM
2006
IEEE
13 years 11 months ago
2006
IEEE
Current Radio Frequency Identification (RFID) systems generally have long design times and low tolerance to changes in specification. This paper describes a field programmable,...
HPCA
2006
IEEE
14 years 6 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
ISCA
2008
IEEE
13 years 12 months ago
2008
IEEE
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...