11 search results - page 1 / 3 » Testing for Interconnect Crosstalk Defects Using On-Chip Emb... |
DAC
2001
ACM
14 years 5 months ago
2001
ACM
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
DAC
2000
ACM
14 years 5 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
TCAD
2010
12 years 11 months ago
2010
Abstract--This paper presents a GALS-compatible circuitswitched on-chip network that is well suited for use in many-core platforms targeting streaming DSP and embedded applications...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
EDCC
2008
Springer
13 years 6 months ago
2008
Springer
The ongoing technological advances in the semiconductor industry make Multi-Processor System-on-a-Chips (MPSoCs) more attractive, because uniprocessor solutions do not scale satis...