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DAC
2008
ACM
14 years 6 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
ISSRE
2005
IEEE
13 years 11 months ago
An Experimental Evaluation on Reliability Features of N-Version Programming
Although N-version programming has been employed in some mission-critical applications, the reliability and fault correlation issues remain a debatable topic in the research commu...
Xia Cai, Michael R. Lyu, Mladen A. Vouk
EUROSYS
2011
ACM
12 years 9 months ago
Refuse to crash with Re-FUSE
We introduce Re-FUSE, a framework that provides support for restartable user-level file systems. Re-FUSE monitors the user-level file-system and on a crash transparently restart...
Swaminathan Sundararaman, Laxman Visampalli, Andre...
JSS
2008
91views more  JSS 2008»
13 years 5 months ago
Software architecture reliability analysis using failure scenarios
We propose an approach for analyzing software architectures with respect to reliability to improve fault tolerance. The approach defines a failure scenario model that is based on ...
Bedir Tekinerdogan, Hasan Sözer, Mehmet Aksit
ET
2008
92views more  ET 2008»
13 years 5 months ago
Hardware and Software Transparency in the Protection of Programs Against SEUs and SETs
Processor cores embedded in systems-on-a-chip (SoCs) are often deployed in critical computations, and when affected by faults they may produce dramatic effects. When hardware harde...
Eduardo Luis Rhod, Carlos Arthur Lang Lisbôa...