604 search results - page 1 / 121 » The Hardness of Metric Labeling |
FOCS
2004
IEEE
13 years 8 months ago
2004
IEEE
The Metric Labeling problem is an elegant and powerful mathematical model capturing a wide range of classification problems. The input to the problem consists of a set of labels a...
APPROX
2007
Springer
13 years 10 months ago
2007
Springer
Abstract. We study the problem embedding an n-point metric space into another n-point metric space while minimizing distortion. We show that there is no polynomial time algorithm t...
IAT
2009
IEEE
13 years 8 months ago
2009
IEEE
When intelligent systems reason about complex problems with a large hierarchical classification space it is hard to evaluate system performance. For classification problems, differ...
SEFM
2007
IEEE
13 years 10 months ago
2007
IEEE
Directed model checking algorithms focus computation resources in the error-prone areas of concurrent systems. The algorithms depend on some empirical analysis to report their per...
KDD
2009
ACM
14 years 5 months ago
2009
ACM
Active and semi-supervised learning are important techniques when labeled data are scarce. Recently a method was suggested for combining active learning with a semi-supervised lea...