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ICPP
2007
IEEE
13 years 11 months ago
Multi-Layer Event Trace Analysis for Parallel I/O Performance Tuning
The complexity of parallel I/O systems lies in the deep I/O stack with many software layers and concurrent I/O request handling at multiple layers. This paper explores multi-layer...
Pin Lu, Kai Shen
IFM
2007
Springer
129views Formal Methods» more  IFM 2007»
13 years 11 months ago
Slotted-Circus
Material Flow Abstraction of Manufacturing Systems. ‣Umberto Costa, Ivan de Medeiros Jr and Marcel Oliveira. Specification and Verification of a MPI Implementation for a MP-SoC...
Andrew Butterfield, Adnan Sherif, Jim Woodcock