14 search results - page 1 / 3 » The Soft Error Problem: An Architectural Perspective |
HPCA
2005
IEEE
13 years 10 months ago
2005
IEEE
DAC
2005
ACM
13 years 6 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
VLSID
2003
IEEE
14 years 4 months ago
2003
IEEE
Reducing leakage power and improving the reliability of data stored in the memory cells are both becoming challenging as technology scales down. While the smaller threshold voltag...
DSD
2010
IEEE
13 years 2 months ago
2010
IEEE
Abstract--Recent technology trends have made radiationinduced soft errors a growing threat to the reliability of microprocessors, a problem previously only known to the aerospace i...
LCTRTS
2009
Springer
13 years 11 months ago
2009
Springer
Register file (RF) is extremely vulnerable to soft errors, and traditional redundancy based schemes to protect the RF are prohibitive not only because RF is often in the timing c...